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EAMC3

  • The 3rd East-Asia Microscopy Conference
  • November 7~10, 2017
  • BEXCO in Busan, South Korea


A.
Instruments & Techniques
A-1. Instrumentation
A-2. Advanced TEM/STEM
A-3. In-situ TEM
A-4. Scanning Probe Microscopy
A-5. X -ray Microscopy for Materials Application
A-6. Phase TEM: Lorentz TEM/Holography/DPC
A-7. Atom Probe Microscopy
B.
Materials Science
B-1. Materials for Industry: Semiconductor and Battery
B-2. Nano Materials
B-3. Structural Materials
B-4. Functional Oxides
B-5. Low-Dimensional Materials
C.
Life Sciences
C-1. Histology and Cell Biology
C-2. Biology of Plants and Microbes
C-3. 3-dimensional Electron Microscopy (Cryo-EM, Electron tomography)
C-4& 5. Molecular Labeling and Super-resolved Fluorescence Microscopy
C-6. Connectomics
C-7. High voltage electron microscopy
C-8. Correlative Microscopy
C-9. Tissue Clearing and Mesoscale Imaging
C-10. Synchrotron
C-11. Real time imaging

TOP


EAMC3 Secretariat : 3F, 34, Dogok-ro 4-gil, Gangnam-gu, Seoul, 06265, Korea, E-mail) secretariat@eamc3.org, Tel) +82-2-574-6209, Fax) +82-2-573-6208

(사)한국현미경학회
사업자등록번호 : 209-82-06363, 대표자 : 신기삼 교수, 전화번호 : 02-919-8775, 사업장주소 : 서울특별시 서대문구 연세로 50(신촌동, 연세대학교 공학원 B187H호)
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